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Coordinate Metrology Society Releases CMSC 2013 Measurement Study Report

December 30, 2013

PRESS RELEASE
For Immediate Release

CMS Press Contact: Belinda Jones, HiTech Marketing
860-399-1147, belinda.jones@hitechmarketing.com


The Coordinate Metrology Society Unveils the

CMSC 2013 Measurement Study Report


Non-Contact Scanning:

How Data is Affected by the Decisions We Make


Benbrook, TX – December 30, 2013 – The Coordinate Metrology Society (CMS) today announced the results of their fourth large-scale measurement study performed at the 29th annual Coordinate Metrology Systems Conference (CMSC) held in San Diego, CA. The study was developed to support the CMS Level II Certification Examination development process, which will culminate in the industry’s first instrumentation-based Certification program for portable 3D metrology. The study’s main focus was to evaluate how decisions made during and after measurement affect the final measurement result. The 50-page report entitled “Non-Contact Scanning: How Data is Affected by the Decisions We Make details the results and analysis of the interactive measurement study. Professionals in the metrology field work in diverse industries such as aerospace, automotive, power generation, and more. The new report is now available for the members of the CMS.


Over a two day period, CMSC conference attendees participated in the data collection activity in the Measurement Study booth. The objective of the study was to engage the CMSC community in the practical methodology required to support certified operators and programmers. In addition, participants were asked to evaluate the appropriateness of the tasks in relation to the CMS Certification development. Four stations accommodated participants carrying out practical tasks using a portable articulating arm and a scanning system. Six Analysis Stations were available to observe decisions made while interpreting data, and examine how those choices can influence measurement results. The exercise provided a hands-on challenge for participants regardless of their expertise with scanning systems or knowledge of metrology. A workshop was held on the third day of the conference to review the results and to learn about future measurement studies for CMSC.
The study was coordinated by the National Physical Laboratory (UK) and event sponsor Metrologic Group, assisted by members of the CMS Certification Committee, Coventry University, and volunteers from many OEMs and software developers in the metrology industry. Author Keith Bevan from the National Physical Laboratory performed statistical analysis of the study and compiled those conclusions into the new report, which was peer-reviewed by the organization’s Executive and Certification Committees.


About the Coordinate Metrology Society
The Coordinate Metrology Society is a membership of users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. The society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information about the CMS and how to join the organization, visit their web site at http://www.CMSC.org.


About the Coordinate Metrology Systems Conference
The Coordinate Metrology Systems Conference is an annual event sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe. CMSC has achieved world renown for its comprehensive program of top-shelf technical papers and applications presentations given by industry experts from science/research laboratories and leading manufacturing industries. No other trade show rivals the high level of authoritative information provided by CMS members and master users of metrology instrumentation, software, and peripheral equipment for quality control, quality production, and precision assembly and metrology-aided alignment. The CMS publishes the Journal of the CMSC, a bi-yearly publication featuring outstanding technical papers presented during the conference.



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