Abstract
A concepts presentation rather than a product talk. Walk-around probing had arrived by 2006 – the Leica T-System, API's Intelliprobe, Metris K-Scan and iGPS, Metronor Solo – but Stephen Kyle asks whether it does enough, and sketches optically jointed systems that would reduce the need for direct line of sight to the feature, reach deeper into a measured object, and lend themselves to automation inside a manufacturing cell. Joints in a fixed link arm let the probe work around corners; a typical walk-around system, by comparison, is an arm with one joint fewer, one variable-length link and a short link to the probe tip. The first half treats whole systems, the second some of the components they would need.
Also published as CMSJ-02-1-04, The Journal of the CMSC, Volume 2, Number 1 (Spring 2007).
Cite this paper
Stephen Kyle. Metrology 3+; University College London. Presented at the Coordinate Metrology Systems Conference 2006, Orlando, Florida, July 17-21, 2006. Coordinate Metrology Society, reference CMS-2006-011.