Abstract
Several methods have been proposed for quantifying the structural resolution of a short-range laser scanner – the peak test, the wedge test and the slanted-edge test of ISO 12233 – and all of them produce a spatial response curve representing a low-pass filter. Those curves are usually just compared by eye. David MacKinnon asks for something better: a metric that is independently verifiable and metrologically traceable, so that instruments can be compared, fitness for purpose verified, and warranty questions settled on evidence. The talk sets out the problem, the three methods, the test procedure used to compare them and the results, and says plainly that no method is broadly accepted yet.
Cite this paper
David MacKinnon. National Research Council Canada, Institute for Information Technology. Presented at the Coordinate Metrology Systems Conference 2009, Louisville, Kentucky, July 20-24, 2009. Coordinate Metrology Society, reference CMS-2009-011.