Exploratory Analysis of Part Inspection with Metrology Software Using Structured Light Scanners

Abstract

Part inspections with large data sets are progressively gaining widespread acceptance in quality assurance systems with the recent improvements in metrology software and devices. Fast 3-D acquisition of large data sets coupled with relative ease of use makes structured light scanners a good alternative to existing metrology systems. The aim of this presentation is to analyze the measurement procedures for part inspection with metrology software using a structured light scanner in a non-controlled environment and demonstrate the impact of different factors on data acquisition and analysis. Experimental test cases combining these factors are discussed, and accordingly, best practices are proposed.