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CMS-2026-019

Universal Machine Learning

Tom Hess

Title graphic for CMS-2026-019: Universal Machine Learning

Abstract

Deep learning approaches a vision problem the way a person does – trained on examples rather than programmed with rules – and Tom Hess sets that against manual inspection point by point: fast enough to keep pace with in-line production, consistent across every shift and every line, and improving as more examples arrive after deployment. The documented output is what makes it defensible: yield improvement through real-time process control, analytics for offline improvement work, external reporting to the customer, and traceability for failure analysis later. A pump assembly case study shows the labelling and marking workflow, where the operator supplies the labels and the system returns location, classification and match scores without a vision expert in the loop.

Presentation media

4 video clips from this presentation are available to CMS members.

Cite this paper

Tom Hess. 3D Infotech, Inc. Presented at the Coordinate Metrology Systems Conference 2026, Dallas, Texas, July 20-24, 2026. Coordinate Metrology Society, reference CMS-2026-019.