Precision 2D Laser Scanning: Overview and Applications

Abstract

Anovel method for laser-scanning two-dimensional (2D) profiles, developed at Argonne National Laboratory and presented at CMSC 2011, has been improved and adapted for specialized 2D and 3D applications, including measurement of thermal shifts in superconducting (SC) devices and measurement of polymer X-ray windows. The photo-realistic image at the top of this article shows an instrument that measures these shifts for particle accelerators, the new portable Cryoscanner. This article presents an overview of the evolution and improvements in the hardware, controls, and data acquisition/processing methods as well as applications for these unique laser-scanning devices. precision 2D laser-profile scanning techniques used to solve metrology problems that are either physically difficult or costprohibitive to perform using other instruments. Although the specific applications for these devices are somewhat limited, the technique can be more generally useful in instances where other options are not available.