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2012 Conference Agenda


 

Jul 16

7:30 am
3:00 pm

Boeing Only Workshop

Location: Chamber I
11:00 am
5:00 pm

Exhibitor Registration Open

Location: Roosevelt Pre Function
12:00 pm
5:00 pm

Exhibitor Hall Open for Setup - BADGE REQUIRED

Location: Roosevelt Ballroom
12:00 pm
5:00 pm

Attendee Registration Open & Speaker Check-In

Location: Roosevelt Pre Function
2:00 pm
4:00 pm

CMS Certification Pilot Exam Testing Seating 1

Location: Pontalba
3:00 pm
6:00 pm

Boeing Only: Boeing Enterprise Metrology Team Update

Location: Chamber I
6:30 pm
7:00 pm

New Attendee Orientation with Chairperson Chuck Pfeffer

Location: Waldorf Astoria Ballroom
7:00 pm
9:00 pm

CMSC Icebreaker sponsored by FARO

Location: Crescent City Ballroom
Sponsors:FARO

Jul 17

7:00 am
8:00 am

Breakfast sponsored by Brunson Instrument Company

Location: Crescent City Ballroom
Sponsors:Brunson Instrument Company
7:30 am
2:30 pm

Registration Open

Location: Roosevelt Pre Function
8:00 am
9:00 am

Chair's Welcome: Chuck Pfeffer

Location: Waldorf Estoria Ballroom
This will include the introduction of the Executive Committee and candidates running for the Executive Committee annual electoral positions.
9:00 am
10:00 am

Exhibitor Presentations

Location: Waldorf Estoria Ballroom
Each of our exhibitors will provide a 60 second preview of their products and services.
10:00 am
11:00 am

Introduction of the Proposed CMS Certification Guidlines

Location: Waldorf Estoria Ballroom
A review of the CMS Certification Committee progress and an overview of the Certification Pilot Exam and 2012 Measurement Study
11:00 am
5:00 pm

Executive Committee Election Polls Open

Location: Roosevelt Pre Function
11:00 am
5:00 pm

Data Collection - 2012 CMS Measurement Study sponsored by Metrologic

Location: Roosevelt Ballroom
Sponsors:Metrologic Group
The Importance of Practical Testing
11:00 am
5:00 pm

Exhibit Hall Open

Location: Roosevelt Ballroom
12:00 pm
1:30 pm

Lunch sponsored by Hubbs

Location: Crescent City Ballroom
Sponsors:Hubbs Machine & Manufacturing, Inc.
2:00 pm
4:00 pm

CMS Certification Pilot Exam Testing Seating 2

Location: Chamber IV
4:30 pm
6:00 pm

PolyWorks Users Networking Cocktail

Location: Conti
Sponsors:Innovmetric Software Inc.
4:30 pm
6:00 pm

Geodetic Systems Users Group Meeting

Location: Pentalba
Sponsors:Geodetic Systems, Inc.
4:30 pm
6:00 pm

Verisurf Technical Forum & User Meeting

Location: Bienville
Sponsors:Verisurf Software, Inc.

Jul 18

6:00 am
7:30 am

5 Billion Micron Fun Run/Walk

Location: New Orleans City Park (buses leave outside the hotel lobby at 6:00 a.m. and return at 7:30 a.m.)
Sponsors:Innovmetric Software Inc.
7:00 am
8:00 am

Breakfast sponsored by Verisurf Software, Inc.

Location: Crescent City Ballroom
Sponsors:Verisurf Software, Inc.
7:45 am
2:30 pm

Registration Open

Location: Roosevelt Pre Function
7:50 am
8:00 am

Conference Updates: Chuck Pfeffer

Location: Chamber I
8:00 am
5:00 pm

Executive Committee Election Polls Open

Location: Roosevelt Pre Function
8:00 am
8:30 am

Presentation: Reduced Vertical Separation Minimum (RVSM) - Measurement of Pressure Sensors

Location: Chamber I
Speakers:
Michael Lazar - Representing The Boeing Company
8:00 am
8:30 am

Presentation: Making it Right. Photogrammetric Deformation Analysis of the H.L Hunley Submarine

Location: Chamber II
Speakers:
Benjamin Rennison - Representing Clemson University
8:00 am
10:00 am

CMS Certification Pilot Exam Testing Seating 3

Location: Pontalba
8:30 am
9:00 am

Presentation: Development of a Control Network Crossing a Thermal Boundary: A Wing Jig Case Study

Location: Chamber I
Speakers:
Robert Flynn - Representing MSME
8:30 am
9:00 am

Presentation: Coordinate Metrology and the Proposed E57.02 Static Pose Determination Standard

Location: Chamber II
Speakers:
David MacKinnon - Representing National Research Council Canada
9:00 am
9:30 am

Presentation: Curing Cancer Through Metrology

Location: Chamber I
Speakers:
Ray Ryan - Representing ECM
9:00 am
9:30 am

Presentation: A Model for Geometry-Dependent Length Errors in Length Artifacts

Location: Chamber II
Speakers:
Daniel Sawyer - Representing NIST
9:30 am
10:00 am

Presentation: Measurement Accuracy of a Mirrored Surface Using a Laser Tracker

Location: Chamber I
Speakers:
Robert Elliott - Representing Lockheed Martin
9:30 am
10:00 am

Presentation: Fast Detection of Geometry Defects on Free Form Surfaces Via Inverse Fringe Projection

Location: Chamber II
Speakers:
Andreas Posch - Representing Leibniz University Hannover
10:00 am
10:30 am

Presentation: Use of Optical Metrology Guidance for Precision Robotic Machining Of Composites

Location: Chamber I
Speakers:
Charles Lawrence - Representing GKN
10:00 am
5:00 pm

Exhibit Hall Open

Location: Roosevelt Ballroom
10:00 am
5:00 pm

Data Collection - 2012 CMS Measurement Study sponsored by Metrologic

Location: Roosevelt Ballroom
Sponsors:Metrologic Group
The Importance of Practical Testing
10:00 am
10:30 am

Presentation: Dynamic Referencing in 3D Optical Metrology - Higher Accuracy in Shop Floor Conditions

Location: Chamber II
Speakers:
Charles Mony - Representing Creaform
10:30 am
11:00 am

Presentation: High Resolution 3D Capture of High Speed Objects

Location: Chamber I
Speakers:
Paul Banks - Representing TetraVue
10:30 am
11:00 am

Presentation: Multi-Scale Inspection of Worn Surfaces for Product Regeneration

Location: Chamber II
Speakers:
Moritz Krauss - Representing Leibniz University Hannover
12:00 pm
1:30 pm

Lunch sponsored by LPT

Location: Crescent City Ballroom
Sponsors:Laser Projection Technologies, Inc.
2:30 pm
4:00 pm

Workshop: A Session on End User Perspective on Model Based Definition (MBD)

Speakers:
Brian Pippenger - Representing Rolls-Royce/Purdue University
Gabe Draguicevich - Representing US Navy Reverse Engineering
Paul Huang - Representing US Army Research Lab.
4:30 pm
5:30 pm

An Afternoon with NRK

Location: Conti
Sponsors:New River Kinematics
4:30 pm
5:30 pm

Rapidform Pre-Happy Hour

Location: Pontabla
Sponsors:Rapidform, Inc.
5:30 pm
6:30 pm

Pre-Banquet Happy Hour

Location: Waldorf Astoria Ballroom
Sponsors:ATT Metrology Services,
Metrologic Group Services, Inc.
7:00 pm
10:00 pm

CMSC Banquet

Location: Crescent City Ballroom

Jul 19

7:00 am
8:00 am

Breakfast

Location: Crescent City Ballroom
7:45 am
2:30 pm

Registration Open

Location: Roosevelt Pre Function
7:50 am
8:00 am

Conference Updates: Chuck Pfeffer

Location: Chamber I
8:30 am
9:00 am

Presentation: Fast Endoscopic Geometry Measurement-Fibre Based Fringe Projection for Inner Geometry

Location: Chamber I
Speakers:
Christoph Ohrt - Representing Leibniz University Hannover
8:30 am
9:00 am

Presentation: Comparison of Cloud Data of an Antenna Generated Using Different Measurement Technique

Location: Chamber II
Speakers:
Pravesh Mathur - Representing ISRO Satellite Centre
9:00 am
9:30 am

Presentation: What Light Color Should a White-Light-Scanner Use?

Location: Chamber I
Speakers:
Erik Klaas - Representing Breuckmann
9:00 am
9:30 am

Presentation: Process Improvements in Large Scale Pipe Spool Fabrication Plant Using Laser Radar

Location: Chamber II
Speakers:
Masashi Sato - Representing Hitachi Engineering and Services Co.
9:30 am
10:00 am

Presentation: Non-Contact Metrology Applications Development

Location: Chamber I
Speakers:
Chris Barrow - Representing Lockheed Martin
9:30 am
10:00 am

Presentation: State of the Art & Tried and True: Integration of Electronic and Optical Instruments

Location: Chamber II
Speakers:
William Jansma - Representing Argonne National Lab.
10:00 am
11:30 am

CMSC Career Fair

Location: Roosevelt Ballroom & Crescent City Ballroom
10:00 am
10:30 am

Presentation: 3D Imaging - A Comprehensive Global Implementation and Deployment Solution

Location: Chamber I
Speakers:
Rus Emerick - Representing Schneider-Electric
10:00 am
3:30 pm

Exhibit Hall Opens

Location: Roosevelt Ballroom
10:00 am
10:30 am

Presentation: Tuning of a Sheet Metal Stamping Die of a Large Automotive Body-In-White Panel

Location: Chamber II
Speakers:
Daniel Pyzak - Representing Dassault Systemes
10:30 am
11:00 am

Presentation: 3D digitizing Techniques Used to Measure Surface and Prismatic Features

Location: Chamber I
Speakers:
Azita Belashi - Representing 3D Infotech
10:30 am
11:00 am

Presentation: Correct Application of Cloud Filtering to Increase Efficiency in Tolerance Analysis

Location: Chamber II
Speakers:
Mathieu Dubé-Dallaire - Representing BuildIT
11:00 am
1:00 pm

CMS Certification Pilot Exam Testing Seating 4

Location: Pontalba
12:00 pm
1:30 pm

LUNCH

Location: Crescent City Ballroom
2:30 pm
4:00 pm

Workshop: 2012 CMSC Measurement Study Results

Location: Chamber I
3:30 pm
7:00 pm

Exhibition Hall Closes - Exhibitor Tear-down

Location: Roosevelt Ballroom
4:00 pm
4:45 pm

CMS All-Member Happy Hour and Feedback Session

Location: Chamber II
5:00 pm
5:45 pm

Exhibitor Happy Hour and Feedback Session

Location: Chamber II

Jul 20

7:00 am
8:00 am

Meet for NASA Tour

Location: Hotel Lobby
8:00 am
1:30 pm

NASA - Michoud Assembly Facility Tour (US Citizens Only)

Location: NASA - Michoud Assembly Facility (MAF).
Sponsors:Nikon Metrology
8:00 am
10:00 am

CMS Certification Pilot Exam Testing Seating 5

Location: Pontalba