Call for Papers

The CMS Announces our “Call for Papers"
for the 2012 CMSC in New Orleans, LA
2012 CMSC Technical Paper Guidelines
Coordinate Metrology Systems Conference
measurement professionals, today announced their "Call for Papers" for the 2012
Coordinate Metrology Systems Conference (CMSC). The 28th annual event will be held at The Roosevelt New Orleans in New Orleans, LA from July 16 – 20, 2012.
The organization welcomes abstracts for presentations and technical papers submitted by metrology professionals from leading manufacturers, science laboratories, and academia. Suggested topics include industry best practices, scientific research and developments, and successful applications of 3D coordinate measurement systems. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor.
Important Deadlines for Submission and Publication:
Abstract Submission Deadline . . . . . . . . . . . . . . . . March 1, 2012
Notification of Acceptance . . . . . . . . . . . . . . . . . . . March 15, 2012
Technical Papers Due . . . . . . . . . . . . . . . . . . . . . . May 15, 2012
Presentations Due. . . . . . . . . . . . . . . . . . . . . . . . . June 15, 2012
Final Paper/Presentation Revisions Deadline . . . . . . July 1, 2012
CMSC Conference Dates . . . . . . . . . . . . . . . . . . . . July 16 -20, 2012
Benefits of Presenting at the Coordinate Metrology Systems Conference (CMSC):
The benefits of presenting at the annual Coordinate Metrology System Conference are three-fold:
1)Presenting provides a tremendous opportunity for exposure and recognition by your peers in the field of coordinate metrology.
2)The Executive Committee waives the conference registration and membership fees for individuals presenting at the annual conference. (NOTE: In the case of presentations where there are multiple authors or contributors, the Executive Committee is only able to waive one conference registration and membership fee.)
3)The Coordinate Metrology Society will publish both technical papers and presentations on the CMSC website. Additionally, peer-selected technical papers will be published in The Journal of the CMSC,which is mailed to a large circulation, and distributed at trade shows or conferences that influence participation at the annual CMSC.
For more information about our 2011 CMSC “Call for Papers,” contact Michael Raphael, Technical Presentations Coordinator at presentations@cmsc.org.
Abstract Guidelines
For a complete list of submission guidelines for the abstracts, technical papers, and
presentations, please download the 2012 CMSC Technical Paper Guidelines.
At the 2011 CMSC in Phoenix, Arizona, 26 expert presentations were delivered by
industry leaders from The Boeing Company, Mann+Hummel USA, Rolls-Royce North America, Sigma Space, Northrop Grumman Aerospace Systems, NIST, Lawrence Livermore National Lab, National Physical Laboratory (NPL), University of Ontario Institute of Technology, University of Arizona, Coventry University (UK), and other companies and educational institutions covering technology, theory, and practice to advance the field of 3D metrology.
Paul Banks
Representing TetraVue
Agenda Sessions: Presentation: High Resolution 3D Capture of High Speed Objects
Agenda Sessions: Presentation: High Resolution 3D Capture of High Speed Objects
Chris Barrow
Representing Lockheed Martin
Agenda Sessions: Presentation: Non-Contact Metrology Applications Development
Agenda Sessions: Presentation: Non-Contact Metrology Applications Development
Azita Belashi
Representing 3D Infotech
Agenda Sessions: Presentation: 3D digitizing Techniques Used to Measure Surface and Prismatic Features
Agenda Sessions: Presentation: 3D digitizing Techniques Used to Measure Surface and Prismatic Features
Gabe Draguicevich
Representing US Navy Reverse Engineering
Agenda Sessions: Workshop: A Session on End User Perspective on Model Based Definition (MBD)
Agenda Sessions: Workshop: A Session on End User Perspective on Model Based Definition (MBD)
Mathieu Dubé-Dallaire
Representing BuildIT
Agenda Sessions: Presentation: Correct Application of Cloud Filtering to Increase Efficiency in Tolerance Analysis
Agenda Sessions: Presentation: Correct Application of Cloud Filtering to Increase Efficiency in Tolerance Analysis
Robert Elliott
Representing Lockheed Martin
Agenda Sessions: Presentation: Measurement Accuracy of a Mirrored Surface Using a Laser Tracker
Agenda Sessions: Presentation: Measurement Accuracy of a Mirrored Surface Using a Laser Tracker
Rus Emerick
Representing Schneider-Electric
Agenda Sessions: Presentation: 3D Imaging - A Comprehensive Global Implementation and Deployment Solution
Agenda Sessions: Presentation: 3D Imaging - A Comprehensive Global Implementation and Deployment Solution
Robert Flynn
Representing MSME
Agenda Sessions: Presentation: Development of a Control Network Crossing a Thermal Boundary: A Wing Jig Case Study
Agenda Sessions: Presentation: Development of a Control Network Crossing a Thermal Boundary: A Wing Jig Case Study
Gottfried Frankowski
Representing GF Messtechnik
Paul Huang
Representing US Army Research Lab.
Agenda Sessions: Workshop: A Session on End User Perspective on Model Based Definition (MBD)
Agenda Sessions: Workshop: A Session on End User Perspective on Model Based Definition (MBD)
























