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CMSJ-12-1-04

Dynamic Metrology and ASTM E57.02 Dynamic Measurement Standard

Roger Bostelman, Tsai Hong, Steven Legowik, Mili Shah

Title graphic for CMSJ-12-1-04: Dynamic Metrology and ASTM E57.02 Dynamic Measurement Standard

Abstract

Optical tracking systems are used in a wide range of fields, and their market has dramatically increased over the past several years, reaching $1.2 billion in sales revenue in 2014. This article describes the new ASTM E3064 standard test method procedures for optical tracking systems and will outline the theoretical basis for the analysis of the data from these systems. By way of an example, we will also verify the performance of a 12-camera optical tracking system using these standard procedures and related analysis. An artifact, developed at the National Institute of Standards and Technology (NIST), was verified by a coordinate measuring machine (CMM) and then used in two experiments to verify the test method. This and other in-depth articles are intended to be base references for ASTM E3064. will outline the theoretical basis for the analysis of the data from these systems. This project will also verify the performance of a 12-camera optical tracking system as an example. These experiments were conducted using standard procedures, and the analysis method used the artifact seen in the top of figure 1a, which was measured using a CMM. A second method provided in the standard, not mentioned in this article, allows the measurement results to be used without prior knowledge of artifact measurement from a CMM or similar technology. This and other in-depth articles are expected to be the base references for ASTM E57.02.

Also published as CMS-2016-026, CMSC 2016, Nashville, TN.

Cite this article

Roger Bostelman, Tsai Hong, Steven Legowik, Mili Shah. National Institute of Standards and Technology (NIST), Robotic Research LLC, Loyola University Maryland. The Journal of the CMSC, Volume 12, Number 1, Spring 2017. Coordinate Metrology Society, reference CMSJ-12-1-04.