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Papers by Alexander Zholents

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  1. CMS-2019-002 CMSC 2019 Members

    Metrology in the R&D for a High Repetition Rate Multi User X-ray Free-Electron Laser Facility

    William G. Jansma, Semyon Sorsher, Kamleshkumar Suthar, Emil Trakhtenberg, Alexander Zholents

    Argonne National Laboratory