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Papers by Bala Muralikrishnan

Showing 1–12 of 12 results

  1. CMSJ-12-2-00 Journal · Volume 12, Number 2 (Autumn 2017) Members

    Autumn 2017 Entire Issue

    William G. Jansma, Joel D. Fuerst, Kurt A. Goetze, James E. Rix, Edmund Serwinski, Scott Sandwith, Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok, John W. Dorsey-Palmateer

    Argonne National Laboratory · JDP Metrology Consulting, LLC · National Institute of Standards and Technology (NIST) · New River Kinematics · Northwestern University · Triumph Aerospace Structures

  2. CMSJ-12-2-03 Journal · Volume 12, Number 2 (Autumn 2017) Members

    An Overview of Activities at NIST Toward the Proposed ASTM E57 3D Imaging System Point-to-Point Standard

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok

    National Institute of Standards and Technology (NIST)

  3. CMSJ-12-1-00 Journal · Volume 12, Number 1 (Spring 2017) Members

    Spring 2017 Entire Issue

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer, Marek Franaszek, Jean-Christophe Bry, Nabil Romman, Roger Bostelman, Tsai Hong, Steven Legowik, Mili Shah

    Airbus Operations SAS · Géodésie Maintenance Services · Loyola University Maryland · National Institute of Standards and Technology (NIST) · Robotic Research, LLC

  4. CMSJ-12-1-01 Journal · Volume 12, Number 1 (Spring 2017) Members

    Targets for Relative Range Error Measurement of 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  5. CMSJ-06-1-00 Journal · Volume 6, Number 1 (Spring 2011) Members

    Spring 2011 Entire Issue

    C. Koteshwar Rao, S. Ramjee, Rohit Jain, Pravesh Mathur, Rajeev R. B., M. R. Thyagaraj, K. V. Govinda, T. L. Danabalan, Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges, Masashi Sato, Ghassan M. Chamsine, Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

    Center for Precision Metrology · FARO Technologies, Inc. · Flexure Engineering, LLC · Hitachi Engineering & Services Co., Ltd. · NASA Goddard Space Flight Center · National Institute of Standards and Technology · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation · System Integration Group, ISRO Satellite Center