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Papers by Christopher Blackburn

Showing 21–12 of 12 results

  1. CMSJ-09-1-01 Journal · Volume 9, Number 1 (Spring 2014) Members

    Common-Path Method for Laser Tracker Ranging Calibration

    Christopher Blackburn, Daniel S. Sawyer, Craig Shakarji

    National Institute of Standards and Technology (NIST)

  2. CMSJ-06-1-00 Journal · Volume 6, Number 1 (Spring 2011) Members

    Spring 2011 Entire Issue

    C. Koteshwar Rao, S. Ramjee, Rohit Jain, Pravesh Mathur, Rajeev R. B., M. R. Thyagaraj, K. V. Govinda, T. L. Danabalan, Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges, Masashi Sato, Ghassan M. Chamsine, Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

    Center for Precision Metrology · FARO Technologies, Inc. · Flexure Engineering, LLC · Hitachi Engineering & Services Co., Ltd. · NASA Goddard Space Flight Center · National Institute of Standards and Technology · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation · System Integration Group, ISRO Satellite Center

  3. CMSJ-06-1-02 Journal · Volume 6, Number 1 (Spring 2011) Members

    Choosing Test Positions for Laser Tracker Evaluation and Future Standards Development

    Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges

    Center for Precision Metrology · FARO Technologies, Inc. · National Institute of Standards and Technology

  4. CMS-2016-020 CMSC 2016 Members

    Targets for Relative Range Error Measurement of 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  5. CMS-2014-014 CMSC 2014 Members

    Considerations for Design and In-Situ Calibration of High Accuracy Length Artifacts for Field Testing of Laser Trackers

    Christopher Blackburn, Vincent Lee, Daniel S. Sawyer, Craig Shakarji, Aaron Hudlemeyer, Mark Meuret

    Brunson Instrument Company · NIST