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Papers by Craig Shakarji

Showing 1–8 of 8 results

  1. CMSJ-10-1-00 Journal · Volume 10, Number 1 (Spring 2015) Members

    Spring 2015 Entire Issue

    Eric Hansen, Robert Flynn, Schuyler Q. Horky, Santiago Droll, Aaron Hudlemeyer, Mark Meuret, Daniel S. Sawyer, Christopher Blackburn, Vincent Lee, Craig Shakarji

    Brunson Instrument Co. · Electroimpact, Inc. · National Institute of Standards and Technology (NIST) · National Solar Observatory · New River Kinematics

  2. CMSJ-10-1-04 Journal · Volume 10, Number 1 (Spring 2015) Members

    Considerations for Design and In-Situ Calibration of High-Accuracy Length Artifacts for Field Testing

    Aaron Hudlemeyer, Mark Meuret, Daniel S. Sawyer, Christopher Blackburn, Vincent Lee, Craig Shakarji

    Brunson Instrument Co. · National Institute of Standards and Technology (NIST)

  3. CMSJ-09-1-00 Journal · Volume 9, Number 1 (Spring 2014) Members

    Spring 2014 Entire Issue

    Christopher Blackburn, Daniel S. Sawyer, Craig Shakarji, Zheng Wang, Alistair B. Forbes, Paul G. Maropoulos, Ahmad Barari, Farzaneh Kaji, Randy Swanson, Gregorio Balandran, Scott Sandwith

    National Institute of Standards and Technology (NIST) · National Physical Laboratory (NPL) · New River Kinematics · Spirit AeroSystems, Inc. · University of Bath · University of Ontario Institute of Technology

  4. CMSJ-09-1-01 Journal · Volume 9, Number 1 (Spring 2014) Members

    Common-Path Method for Laser Tracker Ranging Calibration

    Christopher Blackburn, Daniel S. Sawyer, Craig Shakarji

    National Institute of Standards and Technology (NIST)

  5. CMSJ-06-1-00 Journal · Volume 6, Number 1 (Spring 2011) Members

    Spring 2011 Entire Issue

    C. Koteshwar Rao, S. Ramjee, Rohit Jain, Pravesh Mathur, Rajeev R. B., M. R. Thyagaraj, K. V. Govinda, T. L. Danabalan, Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges, Masashi Sato, Ghassan M. Chamsine, Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

    Center for Precision Metrology · FARO Technologies, Inc. · Flexure Engineering, LLC · Hitachi Engineering & Services Co., Ltd. · NASA Goddard Space Flight Center · National Institute of Standards and Technology · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation · System Integration Group, ISRO Satellite Center