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Papers by Daniel S. Sawyer

Showing 41–18 of 18 results

  1. CMS-2019-017 CMSC 2019 Members

    Using an Abbreviated Scale Bar for Abbreviated Tests

    Vincent Lee, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  2. CMS-2018-002 CMSC 2018 Members

    Technical and Procedural Challenges in the Development of ASTM E3125-17 Documentary Standard

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok

    National Institute of Standards and Technology (NIST)

  3. CMS-2017-020 CMSC 2017 Members

    Development of a New ASTM E57 Point-to-Point Standard Related to 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok

    National Institute of Standards and Technology (NIST)

  4. CMS-2016-020 CMSC 2016 Members

    Targets for Relative Range Error Measurement of 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  5. CMS-2014-014 CMSC 2014 Members

    Considerations for Design and In-Situ Calibration of High Accuracy Length Artifacts for Field Testing of Laser Trackers

    Christopher Blackburn, Vincent Lee, Daniel S. Sawyer, Craig Shakarji, Aaron Hudlemeyer, Mark Meuret

    Brunson Instrument Company · NIST