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Papers by Meghan Shilling

Showing 1–7 of 7 results

  1. CMSJ-12-2-00 Journal · Volume 12, Number 2 (Autumn 2017) Members

    Autumn 2017 Entire Issue

    William G. Jansma, Joel D. Fuerst, Kurt A. Goetze, James E. Rix, Edmund Serwinski, Scott Sandwith, Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok, John W. Dorsey-Palmateer

    Argonne National Laboratory · JDP Metrology Consulting, LLC · National Institute of Standards and Technology (NIST) · New River Kinematics · Northwestern University · Triumph Aerospace Structures

  2. CMSJ-12-2-03 Journal · Volume 12, Number 2 (Autumn 2017) Members

    An Overview of Activities at NIST Toward the Proposed ASTM E57 3D Imaging System Point-to-Point Standard

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok

    National Institute of Standards and Technology (NIST)

  3. CMSJ-12-1-00 Journal · Volume 12, Number 1 (Spring 2017) Members

    Spring 2017 Entire Issue

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer, Marek Franaszek, Jean-Christophe Bry, Nabil Romman, Roger Bostelman, Tsai Hong, Steven Legowik, Mili Shah

    Airbus Operations SAS · Géodésie Maintenance Services · Loyola University Maryland · National Institute of Standards and Technology (NIST) · Robotic Research, LLC

  4. CMSJ-12-1-01 Journal · Volume 12, Number 1 (Spring 2017) Members

    Targets for Relative Range Error Measurement of 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  5. CMS-2018-002 CMSC 2018 Members

    Technical and Procedural Challenges in the Development of ASTM E3125-17 Documentary Standard

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok

    National Institute of Standards and Technology (NIST)