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Papers by Patrick C. Hammett

Showing 1–5 of 5 results

  1. CMSJ-05-1-00 Journal · Volume 5, Number 1 (Spring 2010) Members

    Spring 2010 Entire Issue

    Lansun Stephanie Chang, Paul Zhuo, Wang Gang, Wang Shu Qing, Patrick C. Hammett, Luis M. Garcia-Guzman, Steven W. Geddes, Patrick T. Walsh, John W. Dorsey-Palmateer, Steven D. Hand, Michael J. Hardin, William J. Mongon, Marcie Renner, David Krop

    Accurex Measurement, Inc. · China National Astronomical Observatories · FARO Technologies, Inc. · Manufacturing Validation Solutions LLC · SURVICE Metrology · The Boeing Company · The Mariners' Museum · University of Michigan Transportation Research Institute

  2. CMSJ-05-1-02 Journal · Volume 5, Number 1 (Spring 2010) Members

    Quantifying Alignment Effects in 3D Coordinate Measurement

    Patrick C. Hammett, Luis M. Garcia-Guzman, Steven W. Geddes, Patrick T. Walsh

    Manufacturing Validation Solutions LLC · University of Michigan Transportation Research Institute

  3. CMSJ-04-1-00 Journal · Volume 4, Number 1 (Spring 2009) Members

    Spring 2009 Entire Issue

    John A. Greenwood, Mikhail A. Kubantsev, Ryota Nozaki, Masashi Sato, Akihiro Oyama, Patrick C. Hammett, Amir Fallahi, Steven W. Geddes, Kwanghan Lee, Maria Hennes, Manfred Juretzko, Brad Wilson, Yishai Galatzer

  4. CMSJ-04-1-03 Journal · Volume 4, Number 1 (Spring 2009) Members

    Datum Transformation Analysis for Production Part Approval Using 3D Noncontact Measurement

    Patrick C. Hammett, Amir Fallahi, Steven W. Geddes, Kwanghan Lee

  5. CMS-2009-005 CMSC 2009 Members

    Alignment Methods and their Impact on Dimensional Results

    Patrick C. Hammett, Luis M. Garcia-Guzman, Steven W. Geddes, Patrick T. Walsh

    University of Michigan, Manufacturing Validation Solutions