Papers by Raymond G. Ohl IV

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CMSJ-06-1-00 Journal · Volume 6, Number 1 (Spring 2011) Members

Spring 2011 Entire Issue

C. Koteshwar Rao, S. Ramjee, Rohit Jain, Pravesh Mathur, Rajeev R. B., M. R. Thyagaraj, K. V. Govinda, T. L. Danabalan, Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges, Masashi Sato, Ghassan M. Chamsine, Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

Center for Precision Metrology · FARO Technologies, Inc. · Flexure Engineering, LLC · Hitachi Engineering & Services Co., Ltd. · NASA Goddard Space Flight Center · National Institute of Standards and Technology · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation · System Integration Group, ISRO Satellite Center
CMSJ-06-1-04 Journal · Volume 6, Number 1 (Spring 2011) Members

Laser Radar Metrology Measurements Through a Chamber Window of James Webb Space Telescope Alignment Fixtures during Cryogenic Testing

Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

Flexure Engineering, LLC · NASA Goddard Space Flight Center · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation