Coordinate Metrology Society logo

Papers by Yanbiao Sun

Showing 1–1 of 1 result

  1. CMS-2019-018 CMSC 2019 Members

    Developing Low Cost Large Volume Metrology for Next-Generation Manufacturing Spaces

    Stuart Robson, Ben Sargeant, Yanbiao Sun, Stephen Kyle, Jan Boehm, Mark Shortis

    3DIMPact Group, University College London (UCL)