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CMS-2001-010

CMM Plus Plus: Large Data Set Metrology in Manufacturing

Meny Benady

Title graphic for CMS-2001-010: CMM Plus Plus: Large Data Set Metrology in Manufacturing

Abstract

Large data set metrology in manufacturing: an analysis of what industry needs and what stands in the way, the 3D reconstruction technology proposed to answer it, and application examples.

Cite this paper

Meny Benady. CogniTens 3D Vision Systems Ltd. Presented at the Coordinate Metrology Systems Conference 2001, Albuquerque, New Mexico, August 13-17, 2001. Coordinate Metrology Society, reference CMS-2001-010.