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CMS-2011-026

The Importance of a Formal Pathway to Successful Training and Education in Metrology

Keith Bevan, Trevor Toman

Title graphic for CMS-2011-026: The Importance of a Formal Pathway to Successful Training and Education in Metrology

Abstract

Two years after Lanny Wilson surveyed what training the dimensional metrology industry was actually getting, and one year after Bevan and Kyle set out what a training programme would need to cover, the argument has hardened into a specific claim: the pathway has to be formal. Keith Bevan of the National Physical Laboratory and Trevor Toman of Coventry University make the case for a structured route through training and education in metrology, with a national laboratory and a university each speaking to the part they are placed to provide.

Cite this paper

Keith Bevan, Trevor Toman. National Physical Laboratory, United Kingdom; Coventry University, United Kingdom. Presented at the Coordinate Metrology Systems Conference 2011, Phoenix, Arizona, July 25-29, 2011. Coordinate Metrology Society, reference CMS-2011-026.