Coordinate Metrology Society logo

Papers from Nikon Metrology, Inc.

Showing 1–10 of 10 results

  1. CMSJ-06-1-00 Journal · Volume 6, Number 1 (Spring 2011) Members

    Spring 2011 Entire Issue

    C. Koteshwar Rao, S. Ramjee, Rohit Jain, Pravesh Mathur, Rajeev R. B., M. R. Thyagaraj, K. V. Govinda, T. L. Danabalan, Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges, Masashi Sato, Ghassan M. Chamsine, Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

    Center for Precision Metrology · FARO Technologies, Inc. · Flexure Engineering, LLC · Hitachi Engineering & Services Co., Ltd. · NASA Goddard Space Flight Center · National Institute of Standards and Technology · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation · System Integration Group, ISRO Satellite Center

  2. CMSJ-06-1-03 Journal · Volume 6, Number 1 (Spring 2011) Members

    System Improvements Based on the Operating Experiences of an Automatic 3D Measurement System

    Masashi Sato, Ghassan M. Chamsine

    Hitachi Engineering & Services Co., Ltd. · Nikon Metrology, Inc.

  3. CMSJ-06-1-04 Journal · Volume 6, Number 1 (Spring 2011) Members

    Laser Radar Metrology Measurements Through a Chamber Window of James Webb Space Telescope Alignment Fixtures during Cryogenic Testing

    Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

    Flexure Engineering, LLC · NASA Goddard Space Flight Center · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation

  4. CMS-2020-012 CMSC 2020 Members

    Mobile Metrology Within the Aerospace Industry

    Doug Kappler, Don Burnard

    Genesis Systems · Nikon Metrology, Inc.

  5. CMS-2020-013 CMSC 2020 Members

    X-Ray CT Measurement Study

    Andrew Ramsey

    Nikon Metrology, Inc.