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Technical Paper Archive

Papers presented at the Coordinate Metrology Systems Conference. Every abstract is open to all; CMS members download the full papers free.

Showing 461–412 of 412 papers

  1. CMS-2020-019 CMSC 2020 Members

    From High-Resolution Imaging to High-Precision Metrology

    Herminso Villarraga-Gómez, Naomi Kotwal

    Carl Zeiss Industrial Metrology · Carl Zeiss X-ray Microscopy

  2. CMS-2020-020 CMSC 2020 Members

    Magnet Fiducialization for the Advanced Photon Source Upgrade Project

    William G. Jansma, Charles L. Doose, Scott Izzo, Animesh Jain

    Argonne National Laboratory

  3. CMS-2019-002 CMSC 2019 Members

    Metrology in the R&D for a High Repetition Rate Multi User X-ray Free-Electron Laser Facility

    William G. Jansma, Semyon Sorsher, Kamleshkumar Suthar, Emil Trakhtenberg, Alexander Zholents

    Argonne National Laboratory

  4. CMS-2019-003 CMSC 2019 Members

    Towards Right-Sized Limits: A Beginner’s Primer for Rationalizing Build Tolerances

    Robert Flynn, JoanClaire Corbett, Karl Christensen

    Electroimpact, Inc. · Independent

  5. CMS-2019-004 CMSC 2019 Members

    DKIST’s Journey Using Laser Trackers

    Myles Puentes, Shawn Haar, Paul Jeffers, Predrag Sekulic, Mary Liang

    Association of Universities for Research in Astronomy (AURA), National Solar Observatory, Daniel K. Inouye Solar Telescope