Technical Paper Archive
Papers presented at the Coordinate Metrology Systems Conference. Every abstract is open to all; CMS members download the full papers free.
Showing 461–412 of 412 papers
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From High-Resolution Imaging to High-Precision Metrology
Carl Zeiss Industrial Metrology · Carl Zeiss X-ray Microscopy
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Magnet Fiducialization for the Advanced Photon Source Upgrade Project
Argonne National Laboratory
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Metrology in the R&D for a High Repetition Rate Multi User X-ray Free-Electron Laser Facility
Argonne National Laboratory
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Towards Right-Sized Limits: A Beginner’s Primer for Rationalizing Build Tolerances
Electroimpact, Inc. · Independent
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DKIST’s Journey Using Laser Trackers
Association of Universities for Research in Astronomy (AURA), National Solar Observatory, Daniel K. Inouye Solar Telescope
