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Technical Paper Archive

Papers presented at the Coordinate Metrology Systems Conference. Every abstract is open to all; CMS members download the full papers free.

Showing 1621–412 of 412 papers

  1. CMS-2001-011 CMSC 2001 Members

    Optical Metrology Techniques and Applications in Automotive Product Development and Manufacturing

    Thomas Allen, Frank Chen, Mitch Marchi

    Ford Motor Company, Research and Vehicle Technology

  2. CMS-2001-012 CMSC 2001 Members

    Photogrammetric Measurement of the Arecibo Primary Reflector Surface

    Lynn Baker, Kenneth Edmundson

    Geodetic Services, Inc. · National Astronomy and Ionosphere Center, Cornell University

  3. CMS-2001-013 CMSC 2001 Members

    Failure-Mode Metrology Using Projected Target Videogrammetry

    John Greenwood, Christine Darve, Robert Bernstein, Edgar Black, Donna Kubik

    Fermi National Accelerator Laboratory · Illinois Institute of Technology · Northern Illinois University · Northwestern University

  4. CMS-2001-014 CMSC 2001 Members

    Structured Light and Digital Photogrammetry for Factory Floor Measurements

    Horst A. Beyer

    Imetric SA

  5. CMS-2001-016 CMSC 2001 Members

    Compact Range Reflectors: Exposing the Effects of Non-Random Surface Errors Using CLR Technology

    Mark Wright, Bill Griffin

    MetricVision, Inc. · Mission Research Corporation