Coordinate Metrology Society logo

CMSC 2003 Technical Papers

Showing 41–12 of 12 papers

  1. CMS-2003-011 CMSC 2003 Free

    Effects of Surface Variation on CLR Measurement

    Joe Michaud, David B. Ober, Tony Aquino, Tony Slotwinski, Dave Dozor

    MetricVision, Inc.

  2. CMS-2003-012 CMSC 2003 Free

    Permanent Photogrammetry Targeting for Automotive Tooling

    Thomas Vaughan

    BMW Group (Mini)