Coordinate Metrology Society logo
X (Twitter)
YouTube
Facebook

Papers by Steven D. Phillips

Showing 1–5 of 5 results

  1. CMSJ-06-1-00 Journal · Volume 6, Number 1 (Spring 2011) Members

    Spring 2011 Entire Issue

    C. Koteshwar Rao, S. Ramjee, Rohit Jain, Pravesh Mathur, Rajeev R. B., M. R. Thyagaraj, K. V. Govinda, T. L. Danabalan, Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges, Masashi Sato, Ghassan M. Chamsine, Theodore J. Hadjimichael, David A. Kubalak, Pam M. Davila, William L. Eichhorn, J. Eric Mentzell, Raymond G. Ohl IV, Anthony R. Slotwinski, Bente H. Eegholm, Joseph E. Hayden, Gregory A. Scharfstein, Randal C. Telfer

    Center for Precision Metrology · FARO Technologies, Inc. · Flexure Engineering, LLC · Hitachi Engineering & Services Co., Ltd. · NASA Goddard Space Flight Center · National Institute of Standards and Technology · Nikon Metrology, Inc. · Orbital Sciences Corp. · Sigma Space Corporation · System Integration Group, ISRO Satellite Center

  2. CMSJ-06-1-02 Journal · Volume 6, Number 1 (Spring 2011) Members

    Choosing Test Positions for Laser Tracker Evaluation and Future Standards Development

    Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges

    Center for Precision Metrology · FARO Technologies, Inc. · National Institute of Standards and Technology

  3. CMS-2010-015 CMSC 2010 Members

    Choosing Test Positions for Laser Tracker Evaluation and Future Standards Development

    Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Steven D. Phillips, Craig Shakarji, Edward Morse, Robert Bridges

    FARO Technologies, Inc. · National Institute of Standards and Technology (NIST) · University of North Carolina at Charlotte

  4. CMS-2007-010 CMSC 2007 Members

    Laser Trackers: Testing and Standards

    Steven D. Phillips, Bala Muralikrishnan, Daniel S. Sawyer, Christopher Blackburn, Bruce Borchardt, W. Tyler Estler

    National Institute of Standards and Technology (NIST)

  5. CMS-2006-006 CMSC 2006 Members

    Large-Scale Metrology Instrument Performance Evaluations at NIST

    W. Tyler Estler, Daniel S. Sawyer, Bruce Borchardt, Steven D. Phillips

    National Institute of Standards and Technology (NIST)