Papers by Vincent Lee
Showing 21–9 of 9 results
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Artifact for Testing Terrestrial Laser Scanners for Errors Arising from Target Optical Properties
National Institute of Standards and Technology (NIST) · Naval Surface Warfare Center
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Using an Abbreviated Scale Bar for Abbreviated Tests
National Institute of Standards and Technology (NIST)
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Targets for Relative Range Error Measurement of 3D Imaging Systems
National Institute of Standards and Technology (NIST)
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Considerations for Design and In-Situ Calibration of High Accuracy Length Artifacts for Field Testing of Laser Trackers
Brunson Instrument Company · NIST
