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Papers by Vincent Lee

Showing 21–9 of 9 results

  1. CMS-2024-005 CMSC 2024 Members

    Artifact for Testing Terrestrial Laser Scanners for Errors Arising from Target Optical Properties

    Braden Czapla, Vincent Lee, Bala Muralikrishnan, Tam Vo, Matthew Winger

    National Institute of Standards and Technology (NIST) · Naval Surface Warfare Center

  2. CMS-2019-017 CMSC 2019 Members

    Using an Abbreviated Scale Bar for Abbreviated Tests

    Vincent Lee, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  3. CMS-2016-020 CMSC 2016 Members

    Targets for Relative Range Error Measurement of 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  4. CMS-2014-014 CMSC 2014 Members

    Considerations for Design and In-Situ Calibration of High Accuracy Length Artifacts for Field Testing of Laser Trackers

    Christopher Blackburn, Vincent Lee, Daniel S. Sawyer, Craig Shakarji, Aaron Hudlemeyer, Mark Meuret

    Brunson Instrument Company · NIST