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Papers by Vincent Lee

Showing 1–9 of 9 results

  1. CMSJ-12-1-00 Journal · Volume 12, Number 1 (Spring 2017) Members

    Spring 2017 Entire Issue

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer, Marek Franaszek, Jean-Christophe Bry, Nabil Romman, Roger Bostelman, Tsai Hong, Steven Legowik, Mili Shah

    Airbus Operations SAS · Géodésie Maintenance Services · Loyola University Maryland · National Institute of Standards and Technology (NIST) · Robotic Research, LLC

  2. CMSJ-12-1-01 Journal · Volume 12, Number 1 (Spring 2017) Members

    Targets for Relative Range Error Measurement of 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Geraldine Cheok, Vincent Lee, Christopher Blackburn, Dennis Everett, Daniel S. Sawyer

    National Institute of Standards and Technology (NIST)

  3. CMSJ-10-1-00 Journal · Volume 10, Number 1 (Spring 2015) Members

    Spring 2015 Entire Issue

    Eric Hansen, Robert Flynn, Schuyler Q. Horky, Santiago Droll, Aaron Hudlemeyer, Mark Meuret, Daniel S. Sawyer, Christopher Blackburn, Vincent Lee, Craig Shakarji

    Brunson Instrument Co. · Electroimpact, Inc. · National Institute of Standards and Technology (NIST) · National Solar Observatory · New River Kinematics

  4. CMSJ-10-1-04 Journal · Volume 10, Number 1 (Spring 2015) Members

    Considerations for Design and In-Situ Calibration of High-Accuracy Length Artifacts for Field Testing

    Aaron Hudlemeyer, Mark Meuret, Daniel S. Sawyer, Christopher Blackburn, Vincent Lee, Craig Shakarji

    Brunson Instrument Co. · National Institute of Standards and Technology (NIST)

  5. CMS-2026-014 CMSC 2026 Members

    Dual Laser Interferometer: Introduction to the Development and Initial Findings of the DLI Approach for Ball Bar Certification

    William Watt, Ingobert Schmadel, Thomas Gendera, Nick Turicek, Michael Hein, Greg Mann, Vincent Lee

    Inora Technologies, Inc. · National Institute of Standards and Technology (NIST)