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CMS-2017-022

Bringing New Metrology Techniques to the Factory

Thomas M. Hedges, Ghassan Chamsine

Title graphic for CMS-2017-022: Bringing New Metrology Techniques to the Factory

Abstract

It is a difficult task to switch measurement technologies. Every technology will offer capabilities that are of interest to the user and on paper might be the perfect technology for the application. However, before changing technologies a project must be executed to determine the differences between the technologies in the specific application. This presentation looks at some of the real world issues with comparing two technologies with completely different measurement techniques: contact measurements and non-contact measurements. The examples will be comparing CMM measurements to Laser Radar measurements and will discuss accuracy, repeatability, and reproducibility. Topics discussed include: 1. how accuracy is compared (ISO10360 and independent artifacts), 2. what are the factors that lead to differences in measurements (temperature, part holding jigs, alignments), and 3. how to minimize the differences to assure that the new process is equivalent (measurement techniques). Although specific examples will be discussed, the results can help provide guidance applicable to any measurement technology change.

Cite this paper

Thomas M. Hedges, Ghassan Chamsine. Nikon Metrology, Inc., Manassas, VA. Presented at the Coordinate Metrology Systems Conference 2017, Snowbird, Utah, July 17-21, 2017. Coordinate Metrology Society, reference CMS-2017-022.