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CMS-2026-014

Dual Laser Interferometer: Introduction to the Development and Initial Findings of the DLI Approach for Ball Bar Certification

William Watt, Ingobert Schmadel, Thomas Gendera, Nick Turicek, Michael Hein, Greg Mann, Vincent Lee

Title graphic for CMS-2026-014: Dual Laser Interferometer: Introduction to the Development and Initial Findings of the DLI Approach for Ball Bar Certification

Abstract

A ball bar is only as good as the certification behind it. This talk introduces the Dual Laser Interferometer approach to certifying ball bars, its development and the initial findings – work done by Inora Technologies with the Dimensional Metrology Group at NIST, which is the part that matters for anyone who has to defend the traceability of an artefact.

Cite this paper

William Watt, Ingobert Schmadel, Thomas Gendera, Nick Turicek, Michael Hein, Greg Mann, Vincent Lee. Inora Technologies, Inc., Ann Arbor, MI; National Institute of Standards and Technology (NIST). Presented at the Coordinate Metrology Systems Conference 2026, Dallas, Texas, July 20-24, 2026. Coordinate Metrology Society, reference CMS-2026-014.