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Technical Paper Archive

Papers presented at the Coordinate Metrology Systems Conference. Every abstract is open to all; CMS members download the full papers free.

Showing 701–412 of 412 papers

  1. CMS-2017-018 CMSC 2017 Members

    Developing the Light-Controlled Factory

    Stuart Robson, Stephen Kyle, Jan Boehm, Ben Sargeant, Mark Shortis, Patrick Keogh, Glen Mullineux, Jody E. Muelaner, David Ross-Pinnock, Jonathan M. Huntley, Harshana G. Dantanarayana

    Loughborough University · Manufacturing Technology Centre (MTC) · RMIT University · University College London · University of Bath

  2. CMS-2017-020 CMSC 2017 Members

    Development of a New ASTM E57 Point-to-Point Standard Related to 3D Imaging Systems

    Prem Rachakonda, Bala Muralikrishnan, Meghan Shilling, Daniel S. Sawyer, Geraldine Cheok

    National Institute of Standards and Technology (NIST)

  3. CMS-2017-021 CMSC 2017 Members

    Automated, Targetless Photogrammetric Measurement: Potential and Limitations

    Clive Fraser

    Photometrix

  4. CMS-2017-022 CMSC 2017 Members

    Bringing New Metrology Techniques to the Factory

    Thomas M. Hedges, Ghassan Chamsine

    Nikon Metrology, Inc.

  5. CMS-2017-023 CMSC 2017 Members

    Precision 2-D Laser Scanning

    William G. Jansma, Joel D. Fuerst, Kurt A. Goetze, James E. Rix

    Argonne National Laboratory · Northwestern University