Dynamic Metrology and ASTM E57.02 Dynamic Measurement Standard

Volume 12, Issue 1

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Publication Details

Published Date:
Authors: Roger Bostelman, Tsai Hong, Steven Legowik, Mili Shah
Company: CMSC
Print Format: Technical Paper
Citation: Roger Bostelman, Tsai Hong, Steven Legowik, Mili Shah, "Dynamic Metrology and ASTM E57.02 Dynamic Measurement Standard," The Journal of the CMSC, Vol. 12, No. 1, Spring 2017

Abstract

Optical tracking systems are used in a wide range of fields, and their market has dramatically increased over the past several years, reaching $1.2 billion in sales revenue in 2014. This article describes the new ASTM E3064 standard test method procedures for optical tracking systems and will outline the theoretical basis for the analysis of the data from these systems. By way of an example, we will also verify the performance of a 12-camera optical tracking system using these standard procedures and related analysis. An artifact, developed at the National Institute of Standards and Technology (NIST), was verified by a coordinate measuring machine (CMM) and then used in two experiments to verify the test method. This and other in-depth articles are intended to be base references for ASTM E3064.