Speaker Bio:
William Jansma is an Engineering Specialist for the Advanced Photon Source (APS) at Argonne National Laboratory where he is involved in the alignment of particle accelerators and experimental facilities. His career includes work on a wide variety of projects at the APS and other accelerator facilities, including the Argonne Tandem Linear Accelerator, Fermilab, SLAC National Accelerator Laboratory and the Nuclear Science Laboratory at the University of Notre Dame.
William began working at Argonne in 1992 and served as Chief Technician for the APS Survey and Alignment Group from 2001 until 2009. He earned a degree in Mechanical Engineering Technology from Purdue University in 2004. He has had 2 articles published in the Journal of the CMSC, and is one of the first persons to become a CMS Certified 3-D Portable Metrologist, holding certificate number 1-0003.
William and his wife Christine are both Chicago area natives who enjoy bicycling and going to the beach in their spare time.
Abstract:
Precision 2-D Laser Scanning:
Overview and Applications
William G. Jansma, Kurt Goetz
Argonne National Laboratory
In 2010 a novel method for laser scanning of two-dimensional (2-D) profiles was developed at Argonne National Laboratory, and was presented at CMSC2011. Since that time the 2-D coordinate measurement method has been improved and adapted for other specialized applications, including measurement of thermal shift in superconducting devices, and profiling ultra-fine detail in a corrugated RF waveguide structure. This paper describes the evolution and improvements in 2-D laser scanning hardware, controls and data acquisition/processing methods as well as applications for the devices.
